Method of measuring a crystallographic orientation of an object
US9366654B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 13, 2013 |
| Grant date | Jun 14, 2016 |
| Priority date | — |
| Expiry date | Apr 26, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/106
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring a crystallographic orientation of an object using an ultrasonic transducer and a detector array including a plurality of ultrasonic detectors includes: determining a minimum distance between the transducer and the detector of the detector array closest to the transducer; placing the transducer and the detector array in contact with a surface of the object such that the transducer and the detector of the detector array closest to the transducer are separated by at least the minimum distance; using the transducer to generate an ultrasonic surface wave pulse in the surface of the object, the ultrasonic surface wave pulse having a pulse duration and including a longitudinal surface wave and a Rayleigh wave; and measuring a time of flight of a surface wave generated by the transducer between the transducer and each detector of the array to determine the crystallographic orientation of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.