Patent · US Active

Method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis

US9370799B2 · kind B2 · utility

7Cited by
69References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 6, 2015
Grant dateJun 21, 2016
Priority date
Expiry dateOct 6, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/12
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis are provided. The system comprises a fixture assembly which includes a rotatable first fixturing component to support a part in a generally vertical orientation and a rotatable second fixturing component mating with and removably connected to the first fixturing component to transmit torque from the first fixturing component to the second fixturing component. The second fixturing component includes a device for holding the part in a generally horizontal orientation and to permit rotation of the horizontally held part about the measurement axis between first and second predetermined angular positions about the axis. The system also comprises an actuator assembly, a backside illumination assembly, a frontside illumination device, a lens and detector assembly and at least one processor to process electrical signals generated by the lens and detector assembly.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.