Particle measuring device and particle measuring method
US9372072B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 1, 2011 |
| Grant date | Jun 21, 2016 |
| Priority date | — |
| Expiry date | Jul 12, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/4771
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This particle measuring device includes a stage, a reflected light illuminating device, a transmitted light illuminating device, an illumination control device, an imaging device, and an image processing device. Based on a transmitted light image acquired by imaging an opaque fine particle group using transmitted light and a reflected light image acquired by imaging an opaque fine particle group using reflected light, by associating transmitted light particles present in the transmitted light image and reflected light particles present in the reflected light image with each other using a predetermined method, various characteristics (the position, the size, the brightness level, and the like) of individual particles out of a fine particle group are simultaneously measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.