Optical plate for calibration of coordinate measuring machines
US9372079B1 · kind B1 · utility
Inventors
Key dates
| Filing date | Dec 24, 2014 |
| Grant date | Jun 21, 2016 |
| Priority date | — |
| Expiry date | Mar 18, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2441
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A coordinate measuring machine is calibrated by taking optical measurements of an optical flat that includes a grating placed on its surface. The arm of the CMM capable of multi-directional translation in relation to an object is fitted with a white-light interferometric objective and optical measurements are taken of the flat while translating the objective (or the flat) in the coordinate direction subject to calibration. The objective may serve also as the probe of the CMM.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.