Organic light emitting diode fabrication with hole transport/injection layer thickness measurement
US9373554B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 25, 2014 |
| Grant date | Jun 21, 2016 |
| Priority date | — |
| Expiry date | Jun 25, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10K2102/351
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method of monitoring an OLED production process for making an OLED device is disclosed. According to the method, at least one reference OLED device similar to said OLED device is fabricated. Said at least one reference OLED device has a layered structure corresponding to said OLED device and a range of hole injection and/or transport layer thicknesses. A spectral variation of a light output of said at least one reference OLED device with respect to variation in said hole injection and/or transport layer thickness is characterized. A said OLED device is partially fabricated by depositing one or more layers comprising at least said hole injection and/or transport layer and a thickness of said one or more layers is measured such that a light output for said partially fabricated OLED device can be predicted, in a target color space, from said measuring, using said characterized spectral variation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.