Method, apparatus, and system for measurement of noise statistics and bit error ratio estimation
US9374202B2 · kind B2 · utility
1Cited by
3References
27Claims
0Family size
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Key dates
| Filing date | Mar 15, 2013 |
| Grant date | Jun 21, 2016 |
| Priority date | — |
| Expiry date | Dec 20, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L1/203
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A sample voltage is received from a device at a first slicer element and a second slicer element. A decision by the first slicer element based on the sample voltage is identified and compared with a decision of the second slicer element based on the sample voltage. The decision of the second slicer element is to be generated from a comparison of the sample voltage with a reference voltage for the second slicer element. Comparing the decisions can be the basis of a soft error ratio determined for a device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.