Heat flux gauge with micro-scale temperature sensors
US9377370B2 · kind B2 · utility
2Cited by
6References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 29, 2012 |
| Grant date | Jun 28, 2016 |
| Priority date | — |
| Expiry date | May 13, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K11/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring temperature parameters of a structure is provided. The apparatus comprises: a carrier including at least one receiving portion; and a plurality of temperature sensors disposed within the at least one receiving portion and secured to the receiving portion via a bonding medium, the sensors being distributed along at least one direction of the carrier and configured to measure and record temperature information through microstructural changes corresponding to temperatures experienced by the respective sensors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.