Patent · US Active

Distinguishing foreign surface features from native surface features

US9377394B2 · kind B2 · utility

2Cited by

58References

20Claims

0Family size

Assignee

Seagate Technology LLC · US

Inventors

Joachim Walter Ahner · Livermore, US
David M. Tung · Livermore, US
Samuel Kah Hean Wong · Johor Bahru, MY
Henry Luis Lott · Fremont, US
Stephen Keith McLaurin · Sunnyvale, US
Maissarath Nassirou · Fremont, US
Florin Zavaliche · San Ramon, US

Key dates

Filing date	Sep 19, 2013
Grant date	Jun 28, 2016
Priority date	—
Expiry date	Jan 6, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/95
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Provided herein is an apparatus, including a photon detector array; and a processing means configured for processing photon-detector-array signals corresponding to a first set of photons scattered from surface features of an article focused in a first focal plane and a second set of photons scattered from surface features of an article focused in a second focal plane, wherein the processing means is further configured for distinguishing foreign surface features of the article from foreign native features of the article.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.