Patent · US Active

Method and device for measuring a moisture value of dielectric materials

US9377417B2 · kind B2 · utility

1Cited by

4References

26Claims

0Family size

Assignee

TEWS ELECTRONIK DIPL. ING. MANFRED TEWS · DE

Inventors

Rainer Herrmann · Hamburg, DE
Udo Schlemm · Hamburg, DE
Hendrik Richter · Hamburg, DE

Key dates

Filing date	Jul 25, 2008
Grant date	Jun 28, 2016
Priority date	—
Expiry date	Sep 23, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01N22/04
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Method for measuring a moisture value F of dielectric materials using at least one microwave resonator, one shift A of the resonant frequency being respectively evaluated for at least two resonance modes with resonant frequencies which are different from one another and a density-independent moisture value being calculated from the measured shifts in the resonant frequency.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.