Patent · US Active

Thermal interface material handling for thermal control of an electronic component under test

US9377486B2 · kind B2 · utility

9Cited by
1References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 28, 2014
Grant dateJun 28, 2016
Priority date
Expiry dateMar 28, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/07307
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Thermal interface material handing is described for thermal control of an electronic component under test. In one example, a thermal control unit is adapted to control the temperature of at least a portion of an electronic component during testing. A pedestal between the thermal control unit and the electronic component conducts heat from the electronic component to the thermal head. A conduit extends through a portion of the pedestal, to permit the flow of a liquid thermal interface material from an external source to a space between the pedestal and the electronic component. The liquid thermal interface material improves heat conduction between the electronic component and the pedestal. An elastomeric seal between the electronic device and the pedestal constrains the thermal interface fluid within the space between the electronic component and the pedestal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.