Wavelet-transform based system and method for analyzing characteristics of a geological formation
US9377548B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 9, 2011 |
| Grant date | Jun 28, 2016 |
| Priority date | — |
| Expiry date | Jun 5, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V1/32
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for analyzing characteristics of a geological formation includes obtaining at a processor data representative of at least one of stratigraphic, structural, or physical characteristics of the geological formation, applying at the processor a wavelet transform to at least a portion of the obtained data or data interpreted or derived from the obtained data to derive one or more wavelet transform coefficients representative of the obtained data, segmenting at the processor at least one or more of the obtained data or data interpreted or derived from the obtained data into segments, determining at the processor a measure of variability of the obtained data or the data interpreted or derived from the obtained data over each segment at one or more scales of the wavelet transform.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.