Method of matching image features with reference features and integrated circuit therefor

US9378431B2 · kind B2 · utility

Assignee

• Metaio GmbH · DE

Inventors

• Norbert Stoeffler · Gräfelfing, DE
• Peter Meier · Munich, DE

Key dates

• Filing date: Nov 18, 2011
• Grant date: Jun 28, 2016
• Expiry date: Mar 7, 2032

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B27/0101
• WIPO field: Audio-visual technology
• WIPO sector: Electrical engineering

Abstract

The invention is related to a method of matching image features with reference features, comprising the steps of providing a current image captured by a capturing device, providing reference features (r), wherein each of the reference features comprises at least one reference feature descriptor (d(r)), determining current features (c) in the current image and associating with each of the current features at least one respective current feature descriptor (d(c)), and matching the current features with at least some of the reference features by determining a respective similarity measure (D(c, r)) between each respective current feature descriptor (d(c)) and each respective reference feature descriptor (d(r)). According to the invention, the determination of the similarity measure is performed on an integrated circuit by hardwired logic or configurable logic which processes logical functions for determining the similarity measure. The invention is also concerned with an integrated circuit for matching of image features with reference features.