Automatic interview question recommendation and analysis
US9378486B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 6, 2014 |
| Grant date | Jun 28, 2016 |
| Priority date | — |
| Expiry date | Dec 9, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q10/105
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Described herein are methods and systems for interview question or prompt recommendation and analysis to improve the quality and efficacy of subsequent evaluation campaigns by combining data sets are described herein. In one method, processing logic selects a first prompt from a first data set of a first candidate evaluation campaign and a second prompt from a second data set of a second candidate evaluation campaign. The processing logic determines whether a degree of similarity between the first prompt and the second prompt exceeds a threshold and combines data from the first data set with data from the second data set to create a combined data set associated with the first prompt and with the second prompt based on the determination.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.