Method and apparatus for processing the signal in spectral domain interferometry and method and apparatus for spectral domain optical coherence tomography
US9383187B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 1, 2013 |
| Grant date | Jul 5, 2016 |
| Priority date | — |
| Expiry date | Nov 1, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2290/60
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Real-time depth measurements in sensing in spectral domain interferometry and for en-face and cross section image production in optical coherence tomography can operate without any need to linearize the data to maximize the output signal and achieve the theoretical depth resolution. Novel interferometry is disclosed, where parameters of a master interferometer dictate the results in a slave interferometer. The master interferometer can be the same measuring interferometer used in two stages. The master interferometer parameters are at least optical path difference (OPD) or the speed of variation of the OPD in the master interferometer. Coherence gated data are produced from selected axial positions which can be from positive or negative optical path differences, in parallel, enabling generation of en-face (C-scan) OCT images simultaneously from several depths, free from mirror terms, and production of A-scans and B-scan OCT images using plural reflectivity values measured in parallel from different depths within A-scans.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.