Patent · US Active

Laboratory X-ray micro-tomography system with crystallographic grain orientation mapping capabilities

US9383324B2 · kind B2 · utility

1Cited by

7References

24Claims

0Family size

Assignee

CARL ZEISS X-RAY MICROSCOPY, INC. · US

Inventors

Michael Feser · Martinez, US
Christian Holzner · Neuenkirchen, DE
Erik Mejdal Lauridsen · Tilst, DK

Key dates

Filing date	Jul 13, 2015
Grant date	Jul 5, 2016
Priority date	—
Expiry date	Jul 13, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG01N2223/606
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and system for three dimensional crystallographic grain orientation mapping illuminates a polycrystalline sample with a broadband x-ray beam derived from a laboratory x-ray source, detects, on one or more x-ray detectors, diffracted beams from the sample, and processes data from said diffracted beams with the sample in different rotation positions to generate three dimensional reconstructions of grain orientation, position, and/or 3-D volume. A specific, cone beam, geometry leverages the fact that for a point x-ray source with a divergent beam on reflection of an extended crystal grain diffracts x-rays such that they are focused in the diffraction plane direction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.