Patent · US Active

Ultrasound inspection system for inspecting a test object with non-planar features

US9383342B1 · kind B1 · utility

8Cited by
15References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 19, 2012
Grant dateJul 5, 2016
Priority date
Expiry dateJan 24, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/2694
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for inspecting a test object with a non-planar feature. A pattern of light is transmitted from a first array of optical fibers associated with a sensor structure onto a surface of the test object at a location of the non-planar feature. The pattern of light is configured to cause sound waves in the test object when the pattern of light encounters the test object. A response to the sound waves is detected using a second array of optical fibers associated with the sensor structure. A determination is made as to whether an inconsistency is present in the test object at the location of the non-planar feature from the response to the sound waves detected using the second array of optical fibers.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.