Ultrasound inspection system for inspecting a test object with non-planar features
US9383342B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 19, 2012 |
| Grant date | Jul 5, 2016 |
| Priority date | — |
| Expiry date | Jan 24, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2694
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for inspecting a test object with a non-planar feature. A pattern of light is transmitted from a first array of optical fibers associated with a sensor structure onto a surface of the test object at a location of the non-planar feature. The pattern of light is configured to cause sound waves in the test object when the pattern of light encounters the test object. A response to the sound waves is detected using a second array of optical fibers associated with the sensor structure. A determination is made as to whether an inconsistency is present in the test object at the location of the non-planar feature from the response to the sound waves detected using the second array of optical fibers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.