Patent · US Active

Antireflective films comprising microstructured surface

US9383482B2 · kind B2 · utility

4Cited by

35References

20Claims

0Family size

Assignee

3M INNOVATIVE PROPERTIES COMPANY · US

Inventors

Christopher B. Walker, Jr. · Windom, US
Christopher P. Tebow · Woodbury, US
Tri D. Pham · Woodbury, US
Steven H. Kong · Woodbury, US
Joseph T. Aronson · Menomonie, US
Kyle J. Lindstrom · Houlton, US
Michael K. Gerlach · Brookline, US
Michelle L. Toy · North St. Paul, US
Taun L. McKenzie · Hugo, US
Anthony M. Renstrom · Maplewood, US
Robert A. Yapel · Oakdale, US
Mitchell A. F. Johnson · Maplewood, US

Key dates

Filing date	May 3, 2011
Grant date	Jul 5, 2016
Priority date	—
Expiry date	Apr 29, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG02B5/0242
WIPO fieldOptics
WIPO sectorInstruments

Abstract

The present invention concerns antireflective films comprising a high refractive index layer (60) and low refractive index layer (80) disposed on the high refractive index layer. The antireflective films have a microstructured surface (70) that can be derived from a microreplicated tool.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.