Patent · US Active

Overlay identification of data processing target structure

US9384118B2 · kind B2 · utility

0Cited by
10References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 29, 2012
Grant dateJul 5, 2016
Priority date
Expiry dateApr 6, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/366
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method, system, and computer program product for identifying an overlay of a data processing target structure in a computing environment is provided. At least one of examining a mapping macro for the target structure with a set of valid ranges, comparing the set of valid ranges with the target structure to identify a string of at least one first invalid value and a last invalid value and locate invalid regions of the target structure, and examining executable code associated with the target structure, comparing at least one unchanged module against at least one additional module exhibiting an overlay characteristic to identify the string of the at least one first invalid value and the last invalid value and locate invalid regions of the target structure, is performed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.