System and method for object dimension estimation
US9384417B1 · kind B1 · utility
3Cited by
2References
3Claims
0Family size
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Key dates
| Filing date | Mar 23, 2015 |
| Grant date | Jul 5, 2016 |
| Priority date | — |
| Expiry date | Mar 23, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30236
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for estimating a size of an object present on two images representing the same scene from different points of view, the method comprising: determining an AAM image model; matching the AAM image model to the images to find a set of parameters describing the shape of the model (pc) and the appearance of the model (λc) for which minimal matching errors for both images occur; and estimating the size of the object based on the differences in locations of points of the AAM image model in the images. The image model is matched to both images mutually, i.e. by using information from both images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.