Optical position measuring instrument

US9389100B2 · kind B2 · utility

Assignee

• DR. JOHANNES HEIDENHAIN GMBH · DE

Inventors

• Wolfgang Holzapfel · Obing, DE
• Joerg Drescher · Riedering, DE
• Markus Meissner · Teupitz, DE
• Ralph Joerger · Traunstein, DE
• Bernhard Musch · Otterfing, DE
• Thomas Kaelberer · Schrobenhausen, DE

Key dates

• Filing date: Nov 8, 2013
• Grant date: Jul 12, 2016
• Expiry date: Dec 15, 2033

Classification

• Technology area (CPC G): Physics
• CPC primary: G01D5/3473
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An optical position measuring instrument including a first scale having a first graduation, wherein the first scale is disposed movable in a first measuring direction, and at a first defined position in the first measuring direction, the first scale includes a spatially limited first marking that differs from the first graduation. The optical position measuring instrument further including a second scale having a second graduation, wherein the second scale is disposed movable in a second measuring direction, and at a second defined position, the second scale includes a second reference marking that is usable for generating at least one reference signal at a reference position of the second scale only if the first scale is located in the first defined position.