Techniques for calibrating measurement systems
US9389275B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 31, 2012 |
| Grant date | Jul 12, 2016 |
| Priority date | — |
| Expiry date | Mar 23, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3191
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Techniques to provide calibration of a measurement system in conjunction with measurement operations. The techniques may include providing a reference device in a signal processing chain within the measurement system. An excitation signal may be driven through the reference device while it may be connected to the signal processing chain within the measurement system and a calibration response may be captured. During a measurement operation, the reference device connection may be complemented with a sensor connection in the signal processing chain and the excitation signal may be driven through the signal processing chain. A measurement response may be captured from the system. The measurement system may generate a calibrated measurement signal that accounts for phase and/or amplitude errors within the system from the calibration response and the measurement response.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.