Identifying impacted tests from statically collected data
US9389986B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 6, 2013 |
| Grant date | Jul 12, 2016 |
| Priority date | — |
| Expiry date | May 6, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3688
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention extends to methods, systems, and computer program products for identifying impacted tests from statically collected data. In general, static dependency data, possibly augmented with some dynamic data, is used to find an appropriate set of impacted tests for code changes. In some embodiments, static dependency analysis is used to identify tests impacted by a code change. Heuristics can be used to assist with identifying an appropriate set of impacted tests to run for a code change. Dynamic data can be used to augment static dependency data to identify more optimal sets of impacted tests to run for a code change.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.