Precision measurement of waveforms using deconvolution and windowing
US9390066B2 · kind B2 · utility
91Cited by
10References
15Claims
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Key dates
| Filing date | Nov 11, 2010 |
| Grant date | Jul 12, 2016 |
| Priority date | — |
| Expiry date | Mar 22, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG10L25/18
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention consists of new ways of constructing a Measuring Matrices (MMs) including time deconvolution of Digital Fourier Transforms DFTs. Also, windowing functions specifically designed to facilitate time deconvolution may be used, and/or the DFTs may be performed in specific non-periodic ways to reduce artifacts and further facilitate deconvolution. These deconvolved DFTs may be used alone or correlated with other DFTs to produce a MM.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.