Patent · US Active

Precision measurement of waveforms using deconvolution and windowing

US9390066B2 · kind B2 · utility

91Cited by
10References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 11, 2010
Grant dateJul 12, 2016
Priority date
Expiry dateMar 22, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG10L25/18
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The invention consists of new ways of constructing a Measuring Matrices (MMs) including time deconvolution of Digital Fourier Transforms DFTs. Also, windowing functions specifically designed to facilitate time deconvolution may be used, and/or the DFTs may be performed in specific non-periodic ways to reduce artifacts and further facilitate deconvolution. These deconvolved DFTs may be used alone or correlated with other DFTs to produce a MM.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.