Data directed acquisition of imaging mass
US9390896B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 14, 2014 |
| Grant date | Jul 12, 2016 |
| Priority date | — |
| Expiry date | Mar 14, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/164
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method of ion imaging is disclosed comprising scanning a sample at a first resolution and acquiring first mass spectral data related to a first pixel location. A determination is then made as to whether or not the first mass spectral data satisfies a condition, wherein if it is determined that the first mass spectral data does satisfy the condition then the method further comprises: (i) switching to acquire second mass spectral data related to a second pixel location which is substantially adjacent to the first pixel location so that the second mass spectral data is acquired at a second resolution which is higher than the first resolution; and (ii) determining whether or not the second mass spectral data satisfies the condition, wherein if it is determined that the second mass spectral data does satisfy the condition then the method further comprises acquiring third mass spectral data related to a third pixel location which is substantially adjacent to the first or second pixel locations so that the third mass spectral is acquired at the second resolution and wherein if it is determined that the second or third mass spectral data does not satisfy the condition then the method fur…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.