Interposer to regulate current for wafer test tooling
US9391447B2 · kind B2 · utility
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2References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 6, 2012 |
| Grant date | Jul 12, 2016 |
| Priority date | — |
| Expiry date | Aug 2, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07385
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An interposer is described to regulate the current in wafer test tooling. In one example, the interposer includes a first connection pad to couple to automated test equipment and a second connection pad to couple to a device under test. The interposer further includes an overcurrent limit circuit to connect the first and second connection pads and to disconnect the first and second connection pads when the current between the first and second connection pads is over a predetermined amount.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.