Defect analysis system for error impact reduction
US9400735B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 27, 2015 |
| Grant date | Jul 26, 2016 |
| Priority date | — |
| Expiry date | Jul 27, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/366
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A first set of data associated with a plurality of data sources is analyzed to determine a plurality of relationships among the first set of data. First rules are generated first rules based, at least in part, on the first set of data, wherein a first of the first rules indicates a first software defect and a cause of the first software defect, wherein a second of the first rules indicates a solution to the first software defect. Determining that the solution to the first software defect is a possible solution to a second software defect is made based, at least in part, on the first and second of the first rules. An indication that first set of data has been modified is received. A relationship between the first set of data and a second set of data associated with the plurality of data sources is determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.