Patent · US Active

Multiple laser time of arrival probe

US9404735B2 · kind B2 · utility

2Cited by

3References

20Claims

0Family size

Assignee

UNITED TECHNOLOGIES CORPORATION · US

Inventors

John E. Paul · Portland, US
Robert Kujawa · Stuart, US
Darren M. Wind · Glastonbury, US

Key dates

Filing date	Dec 19, 2013
Grant date	Aug 2, 2016
Priority date	—
Expiry date	Sep 18, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01B11/16
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system and method for performing stress measurement on rotating parts is disclosed. The system may include a laser assembly configured to emit a plurality of laser beams having different wavelengths, and a probe assembly mounted proximal to a rotatable part in a device. The probe assembly may be configured to output a reflected laser beam onto a first target on the rotatable part. The probe assembly may be configured to output another reflected laser beam onto a second target on the rotatable part. The probe assembly may include a redirector, and a lens assembly mounted proximal to the redirector and configured to converge the laser beams. The redirector may be configured to change the direction of each emitted laser beam.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.