Detector for detecting x-ray radiation parameters
US9405021B2 · kind B2 · utility
0Cited by
6References
15Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 3, 2013 |
| Grant date | Aug 2, 2016 |
| Priority date | — |
| Expiry date | Oct 24, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05G1/00
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
The present invention relates to an X-ray parameter measuring arrangement comprising a detector for measuring said parameter configured to be positioned in a position adjacent to an x-ray source arranged to generate a ray formation having a primary ray portion for radiating an object. The position is chosen in such a way that the interference with a reproduced image is reduced or eliminated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.