Patent · US Active

Argon and helium plasma apparatus and methods

US9406485B1 · kind B1 · utility

20Cited by
21References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 18, 2014
Grant dateAug 2, 2016
Priority date
Expiry dateDec 18, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32972
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An argon and helium plasma apparatus and method are disclosed that operate with argon or helium at atmospheric pressure, and at low temperatures, and with high concentrations of reactive species in the effluent stream. Laminar gas flow is developed prior to forming the plasma and at least one of the electrodes is heated which enables operation at conditions where the argon or helium plasma would otherwise be unstable and either extinguish, or transition into an arc. The apparatus and method can be employed to remove organic materials from a substrate, thereby cleaning the substrate; activate the surfaces of materials thereby enhancing adhesion between the material and an adhesive; kill microorganisms on a surface, thereby sterilizing the substrate; etches thin films of materials from a substrate, and deposit thin films and coatings onto a substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.