Multi-variable yield monitor and methods for the same
US9410840B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 15, 2013 |
| Grant date | Aug 9, 2016 |
| Priority date | — |
| Expiry date | Nov 26, 2033 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA01D41/1277
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A dynamic yield monitor system includes a plurality of instruments to measure harvested crop characteristics while a crop is in-flow within a harvester elevator. The system includes a volume instrument that measures a harvested crop volume from the in-flow harvested crop within the harvester elevator, and a weight instrument that measures a harvested crop weight from the in-flow harvested crop within the harvester elevator. Optionally, the system includes other instruments including a moisture and temperature instrument. A receiver and processing node communicates with the instrument. The receiver and processing determines variable harvested crop test weight based on at least the measured harvested crop volume and measured harvested crop weight of the in-flow crop. The receiver and processing node further determines a variable yield of the harvested crop based on the measured harvested crop volume, the measured harvested crop weight, and the variable harvested crop test weight.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.