Generating test data
US9411712B2 · kind B2 · utility
2Cited by
13References
30Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 9, 2010 |
| Grant date | Aug 9, 2016 |
| Priority date | — |
| Expiry date | Aug 11, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3684
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Generating test data includes: reading values occurring in at least one field of multiple records from a data source; storing profile information including statistics characterizing the values; generating a model of a probability distribution for the field based on the statistics; generating multiple test data values using the generated model such that a frequency at which a given value occurs in the test data values corresponds to a probability assigned to that given value by the model; and storing a collection of test data including the test data values in a data storage system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.