Patent · US Active

Device for measuring magnetic fields with Laplace force

US9417097B2 · kind B2 · utility

1Cited by
3References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 29, 2013
Grant dateAug 16, 2016
Priority date
Expiry dateAug 29, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R33/038
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A device for measuring magnetic fields with Laplace force, comprising a substrate extending in a substrate plane, a first rigid frame in a first plane moveable relative to the substrate about a first rotation axis parallel to the substrate plane with a central through-recess. There is a fixed electrical conductor wound an axis perpendicular to the plane of the first frame. There a first hinge connecting the first rigid frame to the substrate with a first electrical track. There is a second hinge connected to the first rigid frame with a second electrical track. There is a first sensor for measuring of the angular displacement of the first rigid frame. The first hinge and the first electrical track are inside the central recess of the first rigid frame and the second hinge and the second electrical track are outside the central recess of the first rigid frame.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.