Apparatus and method for measuring bending of an object, by using an optical waveguide
US9417143B2 · kind B2 · utility
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12Claims
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Key dates
| Filing date | Mar 6, 2014 |
| Grant date | Aug 16, 2016 |
| Priority date | — |
| Expiry date | Jul 22, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01L5/105
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method for measuring bending of an object, a position of an item touching the object, and a shearing force of the item using an optical waveguide may include a frequency measurer to measure a frequency of light reflected from a grating of an optical waveguide, and a bending measurer to determine bending of an object to which the optical waveguide is attached using the frequency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.