X-ray diffraction based crystal centering method using an active pixel array sensor in rolling shutter mode
US9417196B2 · kind B2 · utility
Inventor
Key dates
| Filing date | Oct 10, 2013 |
| Grant date | Aug 16, 2016 |
| Priority date | — |
| Expiry date | Jul 1, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/20016
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of centering a single crystal sample in the X-ray beam of a diffractometer uses detection of diffraction spots with an active pixel sensor operated in rolling shutter mode. A sample is mounted in the automated goniometer head of the diffractometer and an approximate center of the sample found through which three perpendicular sample axes pass. With a first sample axis perpendicular to a center axis of the X-ray beam, the sample is moved along the first axis from a first position outside of the beam, through the beam and then to a second position outside of the beam. The positions at which first the presence and then the absence of diffraction spots are detected are determined, and the steps repeated for each of the other two perpendicular directions. A precise center may then be found by determining the centroid of the six coordinates thereby obtained.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.