Selection method of satellites for RTK positioning calculation and a selection device of satellites for the same
US9417327B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 9, 2012 |
| Grant date | Aug 16, 2016 |
| Priority date | — |
| Expiry date | Apr 1, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S19/43
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A selection method of satellites for RTK positioning calculation includes initializing a mask threshold of the elevation angle mask and/or the signal strength mask, setting the mask threshold as a first mask threshold other than a mask threshold which carried out an initial setting, performing a first RTK positioning calculation based on a signal from the satellite, performing a first quality check about a positioning solution in the first RTK positioning calculation, and when the first quality check is under the threshold of the ratio test, performing a second RTK positioning calculation based on the signal from the satellite newly chosen via the first mask threshold and performing a second quality check about a second positioning solution in the second RTK positioning calculation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.