Multipoint offset sampling deformation techniques
US9418465B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 31, 2013 |
| Grant date | Aug 16, 2016 |
| Priority date | — |
| Expiry date | Dec 31, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T13/40
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods for performing MOS skin deformations are provided. In one example process, the in vector of a MOS transform may be manually configured by a user. In another example process, a slide/bulge operation may be configured to depend on two or more MOS transforms. Each of the MOS transforms may be assigned a weight that represents the transform's contribution to the overall slide/bulge. In yet another example process, a bulge operation for a MOS vertex may be performed in a direction orthogonal to the attached MOS curve regardless of the direction of the attachment vector. In yet another example process, a ghost transform may be inserted into a MOS closed curve and used to calculate skin deformations associated with first transform of the MOS closed curve.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.