Three-dimensional model refinement
US9418474B2 · kind B2 · utility
2Cited by
6References
22Claims
0Family size
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Key dates
| Filing date | Jan 4, 2009 |
| Grant date | Aug 16, 2016 |
| Priority date | — |
| Expiry date | Mar 28, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2210/41
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A three-dimensional measurement is refined by warping two-dimensional images of an object from offset camera positions according to a three-dimensional model of the object, and applying any resulting discrepancies to refine the three-dimensional model, or to refine one of a number of three-dimensional measurements used to create the three-dimensional model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.