Patent · US Active

Methods of imprint patterning of irregular surface

US9425346B2 · kind B2 · utility

8Cited by
1References
20Claims
0Family size

Assignees

Inventors

Key dates

Filing dateJan 16, 2014
Grant dateAug 23, 2016
Priority date
Expiry dateJan 16, 2034

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02E10/546
  • WIPO fieldOther special machines
  • WIPO sectorMechanical engineering

Abstract

Patterned substrates for photovoltaic and other uses are made by pressing a flexible stamp upon a thin layer of resist material, which covers a substrate, such as a wafer. The resist changes phase or becomes flowable, flowing away from locations of impression, revealing the substrate, which is subjected to some shaping process. A typical substrate is silicon, and a typical resist is a wax. Workpiece textures include extended grooves, discrete, spaced apart pits, and combinations and intermediates thereof. Platen or rotary patterning apparatus may be used. Rough and irregular workpiece substrates may be accommodated by extended stamp elements. Resist may be applied first to the workpiece, the stamp, or substantially simultaneously, in discrete locations, or over the entire surface of either. The resist dewets the substrate completely where desired.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.