Method for detecting hysteresis characteristic of comparator and semiconductor device
US9425776B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 2, 2015 |
| Grant date | Aug 23, 2016 |
| Priority date | — |
| Expiry date | Jun 2, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K5/24
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A method for detecting a hysteresis characteristic of a comparator, include: causing a controller to control an offset adjuster configured to adjust an offset amount of the comparator; causing the controller to change the offset amount from a first value toward a second value and detect a third value when a logic level of a signal output from the comparator is changed; causing the controller to change the offset amount from the second value toward the first value and detect a fourth value when the logic level is changed; and causing the controller to detect the hysteresis characteristic of the comparator based on a first difference between the third value and the fourth value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.