Patent · US Active

Stacked damascene structures for microelectronic devices

US9431343B1 · kind B1 · utility

1Cited by
12References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 20, 2015
Grant dateAug 30, 2016
Priority date
Expiry dateApr 20, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L23/58
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A microelectronic device includes a dual-damascene interconnect structure and a single-damascene line structure directly on the dual-damascene interconnect structure. The dual-damascene interconnect structure and the single-damascene line structure may each include multiple line segments that are arranged in a brick wall pattern. The brick wall pattern may also be used with two or more single-damascene line structures. Various microelectronic devices and related fabrication methods are described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.