Reflectance spectroscopy measuring and sampling system and method for gemstone testing
US9435747B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 16, 2013 |
| Grant date | Sep 6, 2016 |
| Priority date | — |
| Expiry date | Jan 16, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/065
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A reflectance spectroscopy measuring and sampling system for gemstone testing is disclosed. The system includes a first light source (1), a second light source (2), a light filtering element, an integrating sphere (S), an optical fiber (9), a spectroscopic detection module (10), an analog-digital conversion module (11) and a data processing terminal (12), wherein the integrating sphere (S) is provided with an entrance port, a sampling opening (6) and a reflected light exit port (7). A reflectance spectroscopy measuring and sampling method for gemstone testing is also disclosed. The system and the method have an excellent performance and can be widely used in the gemstone identification.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.