Characterization of non-ASE noise on optical signals
US9438336B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 13, 2013 |
| Grant date | Sep 6, 2016 |
| Priority date | — |
| Expiry date | Jan 24, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04J14/06
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
There is provided a method for determining a noise parameter characterizing an optical Signal-Under-Test (SUT) having a signal contribution, an Amplified Spontaneous Emission (ASE) noise contribution and a non-ASE optical noise contribution, such as a carrier-leakage contribution or a depolarized-signal contribution, within an optical-signal bandwidth. The method comprises acquiring optical spectrum trace(s) of the SUT, discriminating at least the non-ASE optical noise contribution from the ASE-noise contribution using the optical spectrum trace(s) and/or a trace obtained from the optical spectrum trace(s); and determining the noise parameter using discriminated non-ASE optical noise contribution and/or the discriminated ASE-noise contribution.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.