Patent · US Active

N-wavelength interrogation system and method for multiple wavelength interferometers

US9441947B2 · kind B2 · utility

1Cited by

1References

21Claims

0Family size

Assignee

Woods Hole Oceanographic Institution · US

Inventors

Jason Kapit · Pocasset, US
Norman E. Farr · Monument Beach, US
Raymond Schmitt · Falmouth, US

Key dates

Filing date	Jan 28, 2014
Grant date	Sep 13, 2016
Priority date	—
Expiry date	Apr 13, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01D5/266
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In an interrogation system for multiple wavelength interferometers a fringe spectrum that includes non-quadrature-spaced radiation-intensity samples is analyzed to obtain a high resolution relative phase measurement of the optical path-length difference associated with the fringe spectrum. The fringe spectrum can be analyzed to obtain a fringe number and a quadrant as well, which can be combined with the relative phase measurement to obtain a high precision measurement of the absolute optical path-length difference. An environmental condition corresponding to the absolute optical path-length difference can be measured using the measurement of the absolute optical path-length difference.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.