Microscope spectrometer, optical axis shift correction device, spectroscope and microscope using same
US9442013B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 20, 2013 |
| Grant date | Sep 13, 2016 |
| Priority date | — |
| Expiry date | Oct 16, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/0076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A microscope spectrometer in which, when an excitation light from a light source illuminates a sample, a light emitted from the sample that enters a microscope is analyzed, may include: a first optical means that forms the light emitted from the sample as a parallel beam; a first variable bandpass filter means having a variable wavelength passband that transmits incident light, which of the parallel beam of incident light, is light of a pre-established wavelength passband; a two-dimensional array light detection means that images the light in the wavelength passband; and a control means that controls the timing of the imaging by the two-dimensional array light detection means and, in accordance with the timing, changes the wavelength passband of the first variable bandpass filter means.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.