Systems and methods for learning of normal sensor signatures, condition monitoring and diagnosis
US9443201B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 12, 2011 |
| Grant date | Sep 13, 2016 |
| Priority date | — |
| Expiry date | Oct 23, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F18/2433
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods to monitor a signal from an apparatus are disclosed. A feature extracted from the signal is automatically defined. Signals are received over a period of time wherein the apparatus is in a normal operational mode. Features are classified in a learning mode and are applied to create a reference model that defines a within-normal operational mode. In a testing mode a signal generated by the apparatus is received, a feature is extracted and classified. Instantaneous data generated in operational mode by the apparatus is classified by the system as abnormal if it does not lie within boundaries of the reference model or contains information/structure in an orthogonal subspace. A learned reference model is augmented by a user or automatically. In one illustrative example the apparatus is a power generation equipment and the signal is an acoustic signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.