Selective display of waveforms governed by measured parameters
US9443490B2 · kind B2 · utility
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11References
17Claims
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Key dates
| Filing date | Jun 29, 2012 |
| Grant date | Sep 13, 2016 |
| Priority date | — |
| Expiry date | Oct 2, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2320/0271
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a test and measurement instrument that includes a signal input structured to receive a modulated radio frequency (RF) signal under test and a demodulator structured to extract a digital signal from the received modulated RF signal. The extracted digital signal has a measurable parameter. The instrument also includes a display controller structured to display the extracted demodulated signal at one of at least two different intensities based on the measured parameter of the digital signal. In other embodiments the signal need not be an RF signal. Methods of operation are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.