Patent · US Active

Local doping of two-dimensional materials

US9449851B2 · kind B2 · utility

1Cited by
0References
18Claims
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Assignee

Inventors

Key dates

Filing dateAug 24, 2015
Grant dateSep 20, 2016
Priority date
Expiry dateAug 24, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02568
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

This disclosure provides systems, methods, and apparatus related to locally doping two-dimensional (2D) materials. In one aspect, an assembly including a substrate, a first insulator disposed on the substrate, a second insulator disposed on the first insulator, and a 2D material disposed on the second insulator is formed. A first voltage is applied between the 2D material and the substrate. With the first voltage applied between the 2D material and the substrate, a second voltage is applied between the 2D material and a probe positioned proximate the 2D material. The second voltage between the 2D material and the probe is removed. The first voltage between the 2D material and the substrate is removed. A portion of the 2D material proximate the probe when the second voltage was applied has a different electron density compared to a remainder of the 2D material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.