Structures and methods for parallel testing of multiple read heads in two dimensional magnetic recording sliders
US9454981B1 · kind B1 · utility
1Cited by
7References
27Claims
0Family size
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Key dates
| Filing date | May 23, 2015 |
| Grant date | Sep 27, 2016 |
| Priority date | — |
| Expiry date | May 23, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B5/4886
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Structures and methods are disclosed for parallel biasing and testing, at dc and high frequency, of two or more read heads within a two dimensional magnetic recording (TDMR) slider. Testing of heads comprises both conventional tests of the individual heads within the slider, as well as tests for interactions between the heads which are very closely spaced within the slider and thus may exhibit various magnetic, capacitive, ohmic, and stress-related interactions not seen in non-TDMR heads having only a single read head. Overall testing times are nearly the same as for single head testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.