IC having failsafe fuse on field dielectric
US9455222B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 18, 2015 |
| Grant date | Sep 27, 2016 |
| Priority date | — |
| Expiry date | Dec 18, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L23/5256
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A fuse circuit includes a substrate, a top semiconductor layer doped a first conductivity type having a well doped a second conductivity type formed therein including a well contact. A field dielectric layer (FOX) is on the semiconductor layer. A fuse is on the FOX within the well including a fuse body including electrically conductive material having a first and second fuse contact. A transistor is formed in the semiconductor layer including a control terminal (CT) with CT contact, a first terminal (FT) with FT contact, and a second terminal (ST) with a ST contact. A coupling path is between the CT contact and well contact, a first resistor is coupled between the FT contact and CT contact, and a coupling path is between the ST contact and the first fuse contact.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.