Automated analytics systems and methods
US9459153B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 17, 2014 |
| Grant date | Oct 4, 2016 |
| Priority date | — |
| Expiry date | Oct 4, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2215/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An automated analytics system can include a sensor system that obtains measurement data by monitoring one or more parameters at each of a number of locations on each of a number of replicated components of an object. A computing device receives the measurement data from the sensor system and uses the measurement data to automatically generate a computerized representation of each of the plurality of replicated components. Thereafter, upon receipt of an input query, the computing device generates a synthesized representation of the object that is specifically directed to a parameter of interest indicated in the query. The synthesized representation may be displayed in a visual format that is interpretable by a human to derive information associated with the parameter of interest.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.